
Analyze nanoscale coatings ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
FT160DesktopXRFAnalyzer ye looi bï ya tɛmɛPCBKuen fitini ye kɔnɔ semiconductor ku microconnector. A lëu bɛ kɛ̈ɛ̈r koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor koor
FT160Polycapillary optical components can be measured less than50 μmA ye tɛ̈n yenë nanoscale coating looi, a ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔ Baara wɛrɛw, cït mɛn, kɛl dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r d Analyzer ee thiin koor ye luɔ̈ɔ̈iQA / QCProcess integrates seamlessly to alert you before problems occur. Process integrates seamlessly to alert you before problems occur. Process integrates seamlessly to alert you before problems occur. Process integrates seamlessly to alert you before problems occur.
Product highlights
FT160Optical and detector technologies are designed specifically for microscopic spots and ultra thin coatings analysis, optimized for minimal features. Optical and detector technologies are designed specifically for microscopic spots and ultra thin coatings analysis, optimized for minimal features.
Window dɔŋ ye tïŋ bɛ̈n tïŋ bɛ̈n tïŋ bɛ̈n tïŋ bɛ̈n tïŋ bɛ̈n tïŋ
Metode de mesure ye gamISO 3497a,ASTM B568kuDIN 50987Standart
IPC-4552Ba,IPC-4553Aa,IPC-4554kuIPC-4556Testing of consistent coating
Automatic characteristic positioning for rapid sample setting (Lɔ̈ɔ̈i ë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë)
Analyzer Configuration Options for Your Application (Analyzer Configuration Options ye gël tënë tɛ̈n yenë yïn luɔ̈ɔ̈i thïn)
ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u50 μmNano-scale coating on characteristic measurement
Lɔ̈k kä ye kek looi në analytics yiic
A lëu bɛ̈n ya tɔ̈ɔ̈u në biäk juëc yiic
A looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi
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FT160 |
FT160L |
FT160S |
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Element Range |
Al <unk> U |
Al <unk> U |
Al <unk> U |
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Detektor |
Silikon drift detektor(SDD) |
Silikon drift detektor(SDD) |
Silikon drift detektor(SDD) |
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XAnode de tubu de ray |
WwalaMo |
WwalaMo |
WwalaMo |
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Aperture |
Multi-capillary Focus |
Multi-capillary Focus |
Multi-capillary Focus |
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Aperture size |
30 μm @ 90%Kuasa (Mo tube) |
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35 μm @ 90%Kuasa (W tubu) |
30 μm @ 90%Kuasa (Mo tube) |
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35 μm @ 90%Kuasa (W tubu) |
30 μm @ 90%Kuasa (Mo tube) |
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35 μm @ 90%Kuasa (W tubu) |
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XYShaft Sample Table Journey |
400 x 300 mm |
300 x 300 mm |
300 x 260 mm |
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Maksimum Sample Size |
400 x 300 x 100 mm |
600 x 600 x 20 mm |
300 x 245 x 80 mm |
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Sample Focus |
Laser Focus ku Auto Focus |
Laser Focus ku Auto Focus |
Laser Focus ku Auto Focus |
