Park Systems Atomic Power Microscope XE-7

Instrument Profile:

Nano-field research tools ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye. A unique three-axis separation design, a guarantees both XYZ three directions non-coupling effect, in principle eliminating the plane distortion error. A unique three-axis separation design, a guarantees both XYZ three directions non-coupling effect, in principle eliminating the plane distortion error. A ye Z axis scanner ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan A ye tɛ̈n yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen

Park Systems Atomic Power Microscope XE-7 Parameters Technical:

Skaner

Skaner XY

Flexible Guided Closed Loop Control Single Module Scanner

Scanning range 10μm*10μm (optional 50μm*50μm, 100μm*100μm)

Yïïn ye cɔl plane offset: <2nm (40μm*40μm scan)

Skaner Z

Flexible Guide Powerful Scanner

Scanning range 12μm (optional 25μm)

Resonance frequency: >5kHz

Lɔ̈ɔ̈i ye tïŋ piny: 0.03nm

Sample Table

Sample size: 100mm * 100mm * 20mm

Sample weight: zui 500g

Sample Table Movement Range: 13mm * 13mm

Karakteristika:

A. XY direction scan, ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

● Luɔ̈ɔ̈i de XY flatbed scanner ku Z axis scanner

● Scanner ye cɔl flat-panel scanner, ye cɔl a leŋ ye cɔl a leŋ ye cɔl a leŋ ye cɔl a leŋ ye cɔl a leŋ ye cɔl a leŋ ye cɔl a leŋ

● Kɔl ye cɔl horizontal linear error ye cɔl 2nm

● Kɔɔr cɛɛk

II. Non-Contact ™ (Real non-contact) mode bɛ̈n lëu bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈

● Servo Z ye tɛɛr ye 10 ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye tɛɛr ye

● Non-contact mode bɛ̈n dɔ̈ɔ̈r bɛ̈n dɔ̈ɔ̈r bɛ̈n dɔ̈ɔ̈r bɛ̈n dɔ̈ɔ̈r

● Resolution imaging is better than similar atomic microscopes (Resolution imaging is better than similar atomic microscopes) (Resolution imaging is better than similar atomic microscopes) (Resolution imaging is better than similar atomic microscopes)

● Sample compatibility bɛ̈n juak, scan accuracy bɛ̈n juak

Third, zui puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l puɔ̈l

● SPM mode juëc

●Support multi-option measurement modes

●Support of various optional accessories, extending superior performance

4. Zui looi bï ya raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan

● Open sample space, improve sample and needle tip replacement efficiency

● Pre-alignment pin tip installation and coaxial direct optical path intuitively achieve laser alignment

● Swan tail lock ye kɛnɛya bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i