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Ion grinder ArBlade 5000
ArBlade 5000 ye masin ye cɔl Hitachi Ion Grinder. A ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n Kuen ye kɛ̈n ye kɛ̈n
Detalji proizvoda
Ion grinder ArBlade 5000
ArBlade 5000 ye masin ye cɔl Hitachi Ion Grinder.
A ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n
Kuen ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye
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Karakteristika
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Specifications
Karakteristika
Lɔ̈ɔ̈i ye cɔl 1 mm/h*1！
A ye cɔl PLUSII ion gun ye cɔl high current density ion beam ye cɔl high current density ion beam ye cɔl high current density ion beam ye cɔl high current density ion beam ye cɔl high current density ion beam ye cɔl high current density ion beam*2A tɛɛr de grinding.
- *1
- Si ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
- *2
- A ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ
Comparison of Sectional Grinding Results
(Sample: Automatic pencil core, grinding time: 1.5 hours) (Sample: Automatic pencil core, grinding time: 1.5 hours) (Sample: Automatic pencil core, grinding time: 1.5 hours)
Kɔmpani IM4000PLUS
ArBlade 5000
A ka tɛmɛ 8 mm!
Luɔ̈ɔ̈i de kä ye kek looi në ɣän juëc yiic, kä ye kek looi në ɣän juëc yiic, kä ye kek looi në ɣän juëc yiic, kä ye kek looi në ɣän juëc yiic, kä ye kek looi në ɣän juëc yiic
Masin grinding kompozit
IM4000 series composite type (section grinding, plane grinding) ion grinding machine is widely praised. IM4000 series composite type (section grinding, plane grinding) ion grinding machine is widely praised. IM4000 series composite type (section grinding, plane grinding) ion grinding machine is widely praised.
A lëu bï samples ya tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u.
Seksiyon grinding
Lɔ̈ɔ̈i de kä ye kek looi në kä ye kek looi në kä ye kek looi në kä ye kek looi në kä ye kek looi në kä ye kek looi në kä ye kek looi në kä ye kek looi në kä ye kek looi
Flat grinding
Lɔ̈ɔ̈i ka lɔ̈ɔ̈i ka lɔ̈ɔ̈i ka lɔ̈ɔ̈i ka lɔ̈ɔ̈i ka lɔ̈ɔ̈i ka lɔ̈ɔ̈i
Cutting grinding processing diagram
Plane grinding processing diagram
Specifications
| Universal | |
|---|---|
| Gas luɔɔi | Ar ((argon) gaas |
| Voltage acceleration | 0～8 kV |
| Seksiyon grinding | |
| Kä ye kek looi (Si) | 1 mm/hr*11 mm/hr*1 |
| Max grinding width | 8 mm*2 |
| Maksimum Sample Size | 20(W) × 12(D) × 7(H) mm |
| Sample Movement Range | X ±7 mm、Y 0~+3 mm |
| Ion beam intermittent processing function | Konfigurasiɔn Standart |
| Swing angle | ±15°, ±30°, ±40° |
| Flat grinding | |
| Maximum processing range | φ32 mm |
| Maksimum Sample Size | φ50 × 25(H) mm |
| Sample Movement Range | X 0～+5 mm |
| Ion beam intermittent processing function | Konfigurasiɔn Standart |
| Rotational Speed (Rotational Speed) | 1 r/m、25 r/m |
| Tilt angle | 0～90° |
- *1
- Si ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
- *2
- Na cï luɔ̈ɔ̈i kɛ̈ɛ̈l ye kɔrɔ̈t ye kɔrɔ̈t ye kɔrɔ̈t ye kɔrɔ̈t ye kɔrɔ̈t ye kɔrɔ̈t ye kɔrɔ̈t
Awowa
| Proyek | Wël |
|---|---|
| High wear resistant blocker | A ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ |
| Mikroskop ye luɔɔi | Amplification 15×~100× double-eyed, triple-eyed (CCD lëu bɛ̈n tääu) |
Kategori Karewa
- Elektron mikroskop ye cɔl Field Emission Scanning Microscope (FE-SEM)
- Mikroskop Elektron (SEM)
- Mikroskop elektron ye cath (TEM/STEM)
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