Karakteristika instrumenti:

Agilent 7500 series yam ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈lKuen analytik ye kɔnɔ. A 7500 series yam ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr

Agilent ICP teknoloji ye luui në:

● Kuen ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r
● Analyze of semiconductor materials
● Sample analysis cït glass, ceramic ku mineral metallurgy;
• puɔ̈ɔ̈c geoloji;
• Bio-food kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya kɛnɛya;
● Analisis materiyali nuklear
● Analiz sampol petrokimikal;
• Applied and research in forensics (Applied and research in forensic) (Applied and research in forensic) (Applied and research in forensic) (Applied and research in forensic) (Applied and research in forensic)
● YɛlɛNë ye mɛn, ka tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n yenë kek tɛ̈n

Agilent inductive coupled plasma mass spectrum ICP (Ajilent inductive coupled plasma mass spectrum ICP) (Ajilent inductive coupled plasma mass spectrum ICP) (Ajilent inductive coupled plasma mass spectrum ICP)Karakteristika analitik:

●A lëu bï kä ye kek tɔ̈ɔ̈u në tabel periodique yiic bɛ̈n yök në kaam tök
●KaA tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈nKelas)
●Analyze nafa/Cost ratioKa
●KaWide linear dynamic range -Would be detected directly fromppqHundreds deppmKonsentrasi
●Spectrum line ye yic, ye yicSmall, tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n
●Sample size wïc(ulkaml)Analyze ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor ye koor1～3Minit/Sampel)
●Modèle de détection flexible

Analysis of ultratrace contaminants in commonly used materials in semiconductor industry: Analyze of ultratrace contaminants in commonly used materials in semiconductor industry: Analyze of ultratrace contaminants in commonly used materials in semiconductor industry
Solid:Si;GaAaSingle crystal slice; Quartz, silicon carbide, ku kɔ̈k peei; Electrode metal ye cɔl high purity

Agilent ICPA lëu ba sampol organik analyze:
Agilent ICPHigh-performance, high-power shielding rectangular plasma technology has been used to measure a series of organic samples. High-performance, high-power shielding rectangular plasma technology has been used to measure a series of organic samples. High-performance, high-power shielding rectangular plasma technology has been used to measure a series of organic samples.pptElement ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ
●Kɔc kɔ̈k peei, tɛ̈n kɔ̈k tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n
●Kɔmpi alkali——Ammoniak tetramethyl hydroxide(TMAH)Wait ye
●Sample High Metric——Lithographic glue, LCD,BPSG、PSGKä ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye