Antillon Impedance Meter

Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

A strong anti-static destruction capability, suitable for workshop production lines and laboratory use. A kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ

Bandwidth ye 4.5GHZ-20GHZ, a lëu bï impedance tɔ̈u piny ya tɛmɛ. A bɛ Impedance Measurement Reports looi, ka Impedance Average, Large, Minimum, Tolerance, ku Test Graphics.

PCB material testing, dielectric constant DK and dielectric loss factor DF. Antenna measurement, S parameters, static wave ratio and reflective coefficient. PCB material testing, dielectric constant DK and dielectric loss factor DF. Antenna measurement, S parameters, static wave ratio and reflective coefficient. GGB probe ye Intel's single-end pair differential insertion loss SET2DIL measurement eye map measurement up to 16.0 Gb/S

Ka tɛmɛ wɛ̈t kɔnɔ̈ɔ̈ŋ ye wïc, ka tɛmɛ kɔnɔ̈ɔ̈ŋ ye tɛmɛ kɔnɔ̈ɔ̈ŋ ye tɛmɛ kɔnɔ̈ɔ̈ŋ

Kä ye kek looi në luɔɔi de kä ye kek nyuɔɔth ku kä ye kek nyuɔɔth:

1. Interface ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k

2.High anti-static destructive capacity

3. Multifunctional Integrated Testing Machine

Bandwidth of system up to 20GHz, rising time up to 22.3ps (10% to 90%), based on the relationship between rising time, resolution and impedance lines in IPC650 2.5.5.7Z, you can measure the short line length impedance.

ESD gël circuit, lëu gël 3KV ESD ku ±30V EOS, gël instrument ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni ka dɔɔni. Impedance measurement dynamic real time, no need to do multiple averages and suppress noise instantly showing impedance measurement results, with adjustable spacing test probe, it's easier to test small spacing PCB and FPC boards. Impedance measurement dynamic real time, no need to do multiple averages and suppress noise instantly showing impedance measurement results, with adjustable spacing test probe, it's easier to test small spacing PCB and FPC boards.

A ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam, a ye raan ye gam Foot switch control, a bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.

1.By analyzing the image of the simulation, you can understand deeply the performance of high speed interconnected devices. 1.By analyzing the image of the simulation, you can understand deeply the performance of high speed interconnected devices.

2.Eye map data rate up to 16.0 Gb/s.Can be obtained very precisely. 2.Eye map data rate up to 16.0 Gb/s.Can be obtained very precisely. 2.Eye map data rate up to 16.0 Gb/s.Can be obtained very precisely.

3. ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n

4 Luɔ̈ɔ̈i de code generator ye cɔl virtual code generator, ka code model ye cɔl industry standard (PRBS, K28.5) wala ye cɔl user customized.

5.Defined eye image template, a lëu bï ya tɛmɛ në käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke

6.Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ

7. Simulation of true signals by inserting shaking signals. Simulation of true signals by inserting shaking signals. Simulation of true signals by inserting shaking signals. Simulation of true signals by inserting shaking signals.

Ka kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ

ENA-TDR SET2DIL ee kɔc cɔl Intel: SET2DIL (Singleended TDR to Differential Insertion Loss). Ka tɛmɛ GGB Picoprobe 40A-GSSG-450-TLD probe (cïmën de IPC) ku SET2DIL test software cïmën de China cïmën de IPC-TM-650 method 2.5.5.12A) ka SET2DIL ya tɛmɛ.

ENA-T DR ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath, ye luui apath.

System Specifications:

★ Kuen: 0-150ohm (tök-tök) 0-300ohm (tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n-tɛ̈n)

★ Kuɛl tɛ̈n yenë kek them: ± 0.25% @ 50 ohm

★ Tɛɛr tɛɛr: 6.7mm- 10m

★ Horizontal axis display resolution: 1 ps wala 0.2mm (0.008")

★ Vertical axis display resolution: 0.01 ohm

★ Lɔ̈ɔ̈m: 22.3ps - 300ps lëu bï ya waar

★ Tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm

★ Measurement mode: Single machine can provide single end and differential two measuring modes: Single machine can provide single end and differential two measuring modes: Single machine can provide single end and differential two measuring modes: Single machine can provide single end and differential two measuring modes

★ LOSS Test: E5071C+SET2D1L software and measuring fixtures, can do LOSS test

★ Test Speed: Differential test time takes only about 0.7 seconds (using built-in impedance measurement software) (Tɛmɛ ye software ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye)